We propose a simple microscopic model to numerically investigate thestability of a two dimensional fractional topological insulator (FTI). Thesimplest example of a FTI consists of two decoupled copies of a Laughlin statewith opposite chiralities. We focus on bosons at half filling. We study thestability of the FTI phase upon addition of two coupling terms of differentnature: an interspin interaction term, and an inversion symmetry breaking termthat couples the copies at the single particle level. Using exactdiagonalization and entanglement spectra, we numerically show that the FTIphase is stable against both perturbations. We compare our system to a similarbilayer fractional Chern insulator. We show evidence that the time reversalinvariant system survives the introduction of interaction coupling on a largerscale than the time reversal symmetry breaking one, stressing the importance oftime reversal symmetry in the FTI phase stability. We also discuss possiblefractional phases beyond $\nu = 1/2$.
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机译:我们提出了一个简单的微观模型,以数值方式研究二维分数维拓扑绝缘子(FTI)的稳定性。 FTI的最简单示例由具有相反手性的Laughlin状态的两个解耦副本组成。我们专注于一半填充的玻色子。我们通过添加两个不同性质的耦合项来研究FTI相的稳定性:自旋间相互作用项和在单个粒子水平上耦合拷贝的反对称破坏项。使用精确的对角线化和纠缠谱,我们用数字显示FTIphase对两种扰动都是稳定的。我们将系统与类似的双层分数式Chern绝缘子进行比较。我们显示出证据,时间逆转不变系统比相互作用的打破比时间逆转对称打破了更大范围的相互作用耦合引入,强调了时间逆转对称在FTI相稳定性中的重要性。我们还将讨论超过$ \ nu = 1/2 $的可能的分数相。
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